Comprehensive Structural Analysis of ZnTe and Mn-Doped ZnTe Thin Films

In this work, ZnTe and Mn-doped ZnTe thin films were synthesized and systematically analyzed for their structural properties. The cubic phase of ZnTe was confirmed by the X-ray diffraction (XRD) analysis, which also showed a minor shift in peak positions upon Mn doping, indicating lattice distortion. Several line profile analysis techniques, including the Scherrer method, Williamson–Hall models, Size–Strain Plot method, and Halder–Wagner approach, were used to assess the crystallite size and microstrain of the prepared thin films. The results consistently demonstrated that Mn-doping increased microstrain, internal stress, and energy density while decreasing crystallite size. The tendencies noted were further validated using the Halder-Wagner analysis, which offered better separation of size and strain factors. Increased microstrain and stored energy density imply that substantial internal distortions and lattice flaws are introduced by Mn inclusion. These structural modifications are critical for tailoring the optical, electronic, and magnetic properties of ZnTe thin films, making them ideal candidates for optoelectronic and spintronic applications.